14.5 ESD Characterization DataΒΆ

The ESD characterization data for different ESD devices are summarized in the following.

  • 14.5.1 ESD Performance from 3.3V NMOS transistor
  • 14.5.2 ESD Performance from 3.3V LV N+/PWELL diode
  • 14.5.3 ESD Performance from 3.3V LV P+/NWELL diode
  • 14.5.4. ESD Performance from 3.3V LV NWELL/PSUB diode
  • 14.5.5 ESD Performance from 5V/6V NMOS transistor
  • 14.5.6 ESD Performance from 5V/6V PMOS transistor
  • 14.5.7 ESD Performance from 5V/6V HV N+/PWELL diode
  • 14.5.8 ESD Performance from 5V/6V HV P+/NWELL diode

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      • 1.0 Purpose
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      • 14.0 Reliability Related Rules And Guidelines
        • 14.1 Chip Operating Conditions
        • 14.2 Electro-migration
        • 14.3 Latch-up Rules and Guidelines
        • 14.4 ESD Layout Guidelines
        • 14.5 ESD Characterization Data
          • 14.5.1 ESD Performance from 3.3V NMOS transistor
          • 14.5.2 ESD Performance from 3.3V LV N+/PWELL diode
          • 14.5.3 ESD Performance from 3.3V LV P+/NWELL diode
          • 14.5.4. ESD Performance from 3.3V LV NWELL/PSUB diode
          • 14.5.5 ESD Performance from 5V/6V NMOS transistor
          • 14.5.6 ESD Performance from 5V/6V PMOS transistor
          • 14.5.7 ESD Performance from 5V/6V HV N+/PWELL diode
          • 14.5.8 ESD Performance from 5V/6V HV P+/NWELL diode
        • 14.6 Stress Relief Guidelines
      • Appendix A: Device List for Model and LVS Deck
      • Appendix B: Rules not coded
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    • Physical Verification
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        • 14.0 Reliability Related Rules And Guidelines
          • Previous: 14.4.5 Design Guidelines for 5V/6V HV Diode
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